Nanometrisis participates in iPlasmaNano-VII 2016 (16 – 20 OCTOBER 2016, MARE NOSTRUM HOTEL VRAVRONA GREECE) http://www.iplasmanano.org/
Nanometrisis at MNE 2016
Nanometrisis participated at the MNE 2016 (19-23 September 2016, Vienna, Austria). http://mne2016.org/
Nanometrisis at the Nanotech France 2016 Conference and Exhibition
Nanometrisis participated at the Nanotech France 2016 Conference and Exhibition 01 Jun – 03 Jun 2016 | Paris- France. http://www.setcor.org/conferences/Nanotech-France-2016/conference-program/14
Nanometrisis was at the 13th International Conference on Νanoscience and Nanotechnology 5-8 July 2016
Nanometrisis was at the 13th International Conference on Νanoscience and Nanotechnology 5-8 July 2016 (http://www.nanotexnology.com/index.php/nn). Arrange a B2B meeting with us.
Nanometrisis presents joint paper with NCSRD and IMEC on LER characterization of DSA lines
In the dimensional metrology of surface nanostructures, two critical challenges have been recently emerged; The first is to determine the metrics (parameters and functions) which quantify the uniformity of feature sizes and the sidewall roughness of each feature (line or…
Nanometrisis in CIM conference 2015
Nanometrisis will participate in the CIM conference on 21-23 September 2015, Paris, France (www.metrologie2015.com).
Nanometrisis in the 1st DSA symposium
Nanometrisis will participate in the 1st DSA symposium on 27-28 October 2015, Leuven, Belgium (www.dsasymposium.org).