Warning: preg_match(): Compilation failed: invalid range in character class at offset 4 in /home/nanometr/public_html/wp-content/plugins/lightbox-plus/classes/shd.class.php on line 1384

Warning: preg_match_all(): Compilation failed: invalid range in character class at offset 4 in /home/nanometr/public_html/wp-content/plugins/lightbox-plus/classes/shd.class.php on line 700

Warning: Invalid argument supplied for foreach() in /home/nanometr/public_html/wp-content/plugins/lightbox-plus/classes/shd.class.php on line 707

Warning: preg_match_all(): Compilation failed: invalid range in character class at offset 4 in /home/nanometr/public_html/wp-content/plugins/lightbox-plus/classes/shd.class.php on line 700

Warning: Invalid argument supplied for foreach() in /home/nanometr/public_html/wp-content/plugins/lightbox-plus/classes/shd.class.php on line 707

Nanometrisis attended the 7th National Conference on Metrology (11/12-May-2018, Athens) with an invited talk and one oral presentation

Titles : – Nanotechnology challenges and prospects (invited)

– Commputational Nanometrology of Line Edge Roughness in Semiconductor Manufacturing (oral presentation)

(http://metrologia2018.ece.ntua.gr/)

Nanometrisis @ National Conference on Metrology