Nanometrisis attended the 7th National Conference on Metrology (11/12-May-2018, Athens) with an invited talk and one oral presentation

Titles : – Nanotechnology challenges and prospects (invited)

– Commputational Nanometrology of Line Edge Roughness in Semiconductor Manufacturing (oral presentation)

(http://metrologia2018.ece.ntua.gr/)

Nanometrisis @ National Conference on Metrology