Nanometrisis attended Nanotexnology 2019 NN19 (July 2-July 5, Thessaloniki, Greece) with 1 invited talk and 1 oral presentation.
Titles:
- Denoising line edge roughness measurements using Hidden Markov Models (oral)
- Deep learning nanometrology: Denoising Scanning Electron Microscope images toward Line Edge Roughness measurement with sub-nm accuracy (invited)
(https://www.nanotexnology.com/2019/)
Nanometrisis @Nanotexnology 2019