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Nanometrisis attended Nanotexnology 2019 NN19 (July 2-July 5, Thessaloniki, Greece) with 1 invited talk and 1 oral presentation.

Titles:

  • Denoising line edge roughness measurements using Hidden Markov Models (oral)
  • Deep learning nanometrology: Denoising Scanning Electron Microscope images toward Line Edge Roughness measurement with sub-nm accuracy (invited)

(https://www.nanotexnology.com/2019/)

Nanometrisis @Nanotexnology 2019