Nanometrisis @ 13th Paint Symposium


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Nanometrisis  participated in the 13th Paints Symposium (Athens, March 15/16, 2018) with an Oral presentation Title: Quantitative Characterization of Surface Roughness: Standard Approaches and New Challenges (https://www.greekpaints.com/en/symposium-2018/)

Nanometrisis at PESM 2017


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Nanometrisis team attended the 10th Plasma Etch and Strip for Microtechnology workshop (PESM 2017). October 19-20 2017. Leuven. Belgium. (http://pesm-conference.org/index.php)

Nanometrisis at MNE 2017


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Nanometrisis team attended the 43rd International Conference on Micro and Nano Engineering (MNE 2017). 18-22/9/2017.  Braga. Portugal. (http://mne2017.org/)

Nanometrisis at CIM 2017


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Nanometrisis team attended the 2017 International Metrology Congress (CIM 2017). 19-21/9/2017. Paris. France. (https://www.photonics.com/IndustryEvent.aspx?IEID=2664)

Nanometrisis at EUROMAT 2017


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Nanometrisis team attended the European Congress and Exhibition on Advanced Materials and Processes (EUROMAT 2017). 12-22/9/2017. Thessaloniki. Greece. (http://euromat2017.fems.eu/)

Nanometrisis at NN17


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Nanometrisis team attended the 15th international conference on Nanosciences and Nanotechnologies (NN17). 30/6-7/7 2017. Thessaloniki. Greece. (http://www.nanotexnology.com/)

Nanometrisis at EMLC 2017


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Nanometrisis team attended the EMLC 2017 (33rd European Mask and Lithography Conference). 27-28 June 2017. Dresden. Germany. (http://conference.vde.com/EMLC2017/CALL-FOR-PAPERS/Pages/default.aspx)

Nanometrisis at Vision Dynamics Science & Entrepreneurship


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Nanometrisis team attended the Vision Dynamics Science & Entrepreneurship event on Nanofabrication, Devices and Metrology. 19-20 June 2017. Eindhoven. The Netherlands. (http://www.visiondynamics.nl/workshops/past-events)

Nanometrisis awarded Diana Nyyssonen Award for Best Paper at SPIE Metrology, Inspection, and Process Control


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Our paper “Challenges in LER/CDU metrology of DSA structures: placement error and cross-line correlations” (http://spie.org/Publications/Proceedings/Paper/10.1117/12.2230849)  has been selected as the winner of the Diana Nyyssonen Award for Best Paper at SPIE Metrology, Inspection, and Process Control. The presentation of the award will…

Nanometrisis at iPlasmaNano-VII 2016


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Nanometrisis participates in iPlasmaNano-VII 2016 (16 – 20 OCTOBER 2016, MARE NOSTRUM HOTEL VRAVRONA GREECE) http://www.iplasmanano.org/