“Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy”, March 2019, DOI: 10.1117/12.2523931, Conference: Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2019
Deep learning nanometrology of line edge roughness
“Deep learning nanometrology of line edge roughness”, March 2019, DOI: 10.1117/12.2520941, Conference: Metrology, Inspection, and Process Control for Microlithography XXXIII
Edge placement error and line edge roughness
“Edge placement error and line edge roughness”, March 2019, DOI: 10.1117/12.2523419, Conference: Metrology, Inspection, and Process Control for Microlithography XXXIII
Denoising line edge roughness measurement using hidden Markov models
“Denoising line edge roughness measurement using hidden Markov models”, March 2019, DOI: 10.1117/12.2523422, Conference: Metrology, Inspection, and Process Control for Microlithography XXXIII
Nanometrisis @ SPIE 2019
Nanometrisis participated SPIE 2019 (Advanced Lithography) conference (February 24 – February 28, San Jose, California, USA) with 2 posters and an 2 oral presentations Titles Poster presentations: Edge placement error and line edge roughness Denoising line edge roughness measurement using…
Nano-business Workshop @ 2nd Athens Innovation Festival
Σας περιμένουμε την Δευτέρα 12/11 15:00-16:00, στο Ζάππειο μέγαρο, να μάθουμε και να ακούσουμε για την Νανοτεχνολογία και την σχέση της με την επιχειρηματικότητα στην σύγχρονη κοινωνία, μέσα από την ειδική θεματική ενότητα ομιλιών, στο 2ρο Athens Innovation Festival: https://www.athensinnovation.gr/programma/…
Line edge roughness metrology: Recent challenges and advances toward more complete and accurate measurements
“Line edge roughness metrology: Recent challenges and advances toward more complete and accurate measurements”, October 2018, Journal of Micro/ Nanolithography, MEMS, and MOEMS 17(4), DOI: 10.1117/1.JMM.17.4.041014
2nd place at Athens Startup Awards 2018
Nanometrisis received the 2nd New Entrepreneurship Award at the Athens Start-up Awards, organized for a second consecutive year, by the Athens Chamber of Commerce and Industry (ACCI) and the Attica Region Governance on Wednesday, July 11 2018, at Zappeion Megaron.…
Nanometrisis @ TNW 2018
Nanometrisis participated with a booth at “The Next Web 2018” (TNW 2018) conference in Amsterdam, 24-25 May 2018 https://thenextweb.com/
Nanometrisis @ National Conference on Metrology
Nanometrisis attended the 7th National Conference on Metrology (11/12-May-2018, Athens) with an invited talk and one oral presentation Titles : – Nanotechnology challenges and prospects (invited) – Commputational Nanometrology of Line Edge Roughness in Semiconductor Manufacturing (oral presentation) (http://metrologia2018.ece.ntua.gr/)