Our team over the years has collaborated with the Institute of Informatics & Telecommunications. One of our missions is to solve open problems in nanometrology through Machine Learning based methods. This year, along with Dr. George Giannakopoulos for one of…
Open Job Position
Position: Software Engineer We are looking for software engineers to work on image processing for diagnostic and health related applications. One such application is related to the project “LEGEND: Legionella spp. diagnosis in 2 hours: A lab-on-a-chip for rapid, colorimetric…
Nanometrisis Software used in recent publication on Thin Solid Films journal
We are proud to announce that our software NanoTOPO-SEM (Product link), has been used in the recent publication Chemical vapor deposition of Cu films from copper(I) cyclopentadienyl triethylphophine: Precursor characteristics and interplay between growth parameters and films morphology on Thin…
Paper publications in Micro and Nano Engineering (MNE)
Our company participated in Micro and Nano Engineering with two papers: Vekinis A.A., Constantoudis V., Neural network evaluation of geometric tip-sample effects in AFM measurements. Micro and Nano Engineering 8, art. no. 100057 (2020). DOI: 10.1016/j.mne.2020.100057 Vekinis A.A., Constantoudis V.,…
Startup Entrepreneurship award 2020
Nanometrisis was awarded the “Startup Entrepreneurship award” at ACCI AWARDS 2020 that took place at “The Athens Concert Hall” on January 14 2020 links: https://www.acci.gr/acci/articles/article.jsp?context=103&categoryid=202&articleid=21842 https://www.kathimerini.gr/1060442/article/oikonomia/epixeirhseis/aponemh8hkan-se-dwdeka-epixeirhseis-ta-vraveia-evea-2020 https://www.capital.gr/epixeiriseis/3404737/poies-etaireies-brabeutikan-sta-brabeia-ebea-2020
Nanometrisis @ MNE 2019
Nanometrisis participated Micro & Nano Engineering 2019 conference (September 22 – September 27, Rodos, Greece) with 1 oral presentation, 1 poster and an exhibition booth. Titles: Improving the accuracy of Line Edge Roughness measurement using Hidden Markov Models(poster) Deep Learning…
Nanometrisis @ 84th Thessaloniki International Fair 2019
Nanometrisis participated at the 84th Thessaloniki International Fair TIF2019 (7-15 September 2019, Thessaloniki, Greece)
Nanometrisis @Nanotexnology 2019
Nanometrisis attended Nanotexnology 2019 NN19 (July 2-July 5, Thessaloniki, Greece) with 1 invited talk and 1 oral presentation. Titles: Denoising line edge roughness measurements using Hidden Markov Models (oral) Deep learning nanometrology: Denoising Scanning Electron Microscope images toward Line Edge…
Deep learning denoising of SEM images towards noise-reduced LER measurements
“Deep learning denoising of SEM images towards noise-reduced LER measurements”, June 2019, Microelectronic Engineering 216:111051, DOI: 10.1016/j.mee.2019.111051
Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy
“Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy”, March 2019, DOI: 10.1117/12.2523931, Conference: Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2019