nanometrisis – Nanometrisis

Startup Entrepreneurship award 2020

nanometrisis January 15, 2020January 17, 2020 News

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Nanometrisis was awarded the “Startup Entrepreneurship award” at ACCI AWARDS 2020 that took place at “The Athens Concert Hall” on January 14 2020 links: https://www.acci.gr/acci/articles/article.jsp?context=103&categoryid=202&articleid=21842 https://www.kathimerini.gr/1060442/article/oikonomia/epixeirhseis/aponemh8hkan-se-dwdeka-epixeirhseis-ta-vraveia-evea-2020 https://www.capital.gr/epixeiriseis/3404737/poies-etaireies-brabeutikan-sta-brabeia-ebea-2020

Nanometrisis @ MNE 2019

nanometrisis September 23, 2019October 31, 2019 News

Nanometrisis participated Micro & Nano Engineering 2019 conference (September 22 – September 27, Rodos, Greece) with 1 oral presentation, 1 poster and an exhibition booth. Titles: Improving the accuracy of Line Edge Roughness measurement using Hidden Markov Models(poster) Deep Learning…

Nanometrisis @ 84th Thessaloniki International Fair 2019

nanometrisis September 7, 2019October 31, 2019 News

Nanometrisis participated at the 84th Thessaloniki International Fair TIF2019 (7-15 September 2019, Thessaloniki, Greece)

Nanometrisis @Nanotexnology 2019

nanometrisis June 29, 2019October 31, 2019 News

Nanometrisis attended Nanotexnology 2019 NN19 (July 2-July 5, Thessaloniki, Greece) with 1 invited talk and 1 oral presentation. Titles: Denoising line edge roughness measurements using Hidden Markov Models (oral) Deep learning nanometrology: Denoising Scanning Electron Microscope images toward Line Edge…

Deep learning denoising of SEM images towards noise-reduced LER measurements

nanometrisis June 1, 2019November 1, 2019 Publications

“Deep learning denoising of SEM images towards noise-reduced LER measurements”, June 2019, Microelectronic Engineering 216:111051, DOI: 10.1016/j.mee.2019.111051

Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy

nanometrisis March 1, 2019November 1, 2019 Publications

“Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy”, March 2019, DOI: 10.1117/12.2523931, Conference: Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2019

Deep learning nanometrology of line edge roughness

nanometrisis March 1, 2019November 1, 2019 Publications

“Deep learning nanometrology of line edge roughness”, March 2019, DOI: 10.1117/12.2520941, Conference: Metrology, Inspection, and Process Control for Microlithography XXXIII

Edge placement error and line edge roughness

nanometrisis March 1, 2019November 1, 2019 Publications

“Edge placement error and line edge roughness”, March 2019, DOI: 10.1117/12.2523419, Conference: Metrology, Inspection, and Process Control for Microlithography XXXIII

Denoising line edge roughness measurement using hidden Markov models

nanometrisis March 1, 2019November 1, 2019 Publications

“Denoising line edge roughness measurement using hidden Markov models”, March 2019, DOI: 10.1117/12.2523422, Conference: Metrology, Inspection, and Process Control for Microlithography XXXIII

Nanometrisis @ SPIE 2019

nanometrisis February 24, 2019October 31, 2019 News

Nanometrisis participated SPIE 2019 (Advanced Lithography) conference (February 24 – February 28, San Jose, California, USA) with 2 posters and an 2 oral presentations Titles Poster presentations: Edge placement error and line edge roughness Denoising line edge roughness measurement using…

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