Software for Measurement & Quantification
Software used for the measurement and quantification of geometric and morphological characteristics of micro and nanostructures during semiconductor manufacturing, or the manufacturing of other nanotechnology products.
About Nanometrisis
Our Trusted Clients
Targeted Metrology
Lifting your Information burden
Your reliable partner for nanoproduct and nanoparticle characterization Your expert in the path towards digital transformation.
We provide you with software that is:
· Easy-to-use
· Modular
· Accurate
· Cost-Effective
NanoLER™
NanoCER™
1. Semiconductors/
Photonics
Nanometrisis computational metrology portfolio includes software and methods for the measurement and characterization of nanopattern dimensions and roughness from SEM or AFM images.
We evaluate Machine Learning solutions in nanometrology and we analyze patterns produced with different lithographies (EUV, MP, DSA, NIL).
Nanometrisis launches nanoLER™ and nanoCER™, Pillar_AFM™, and Line_AFM™ software families.
2. Pharmaceuticals Cosmetics
Achieve fast, complete and reliable detection and statistical characterization of nanoparticle size, shape, roughness, distribution and dispersion through the analysis of Scanning Electron Microscope images.
NanoPAR™
NanoBTR™
NanoBER™
3. Cutting Industry
Nanometrisis launches NanoBTR™ and NanoBER™ software for blade edge metrology. NanoBTR™ and NanoBER™ software provides quantitative analysis of:
- Blade geometry
- Blade sharpness
- Blade roughness
- Defect inspection
All dimensional and roughness data is captured down to the nanometer! Our beta version is currently used extensively by one of the largest blade manufacturers in the world.
4. Surface Engineering Industry
Nanometrisis launches NanoTOPO-SEM™ and NanoTOPO-AFM™ software for surface metrology.
nanoTOPO-SEM™ analyses top-down SEM images of surface morphologies and outputs a collection of parameters, metrics, and graphs characterizing mainly spatial aspects of morphologies.
nanoTOPO-AFM™ analyses AFM images of surface morphologies and outputs a collection of parameters, metrics, and graphs characterizing both amplitude and spatial aspects of morphologies
NanoTOPO-SEM™
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Testimonials
“I cannot tell you how important this code has been to enable our roughness studies for DSA lines, which is not easy. We really appreciate your help with this.”
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Our long experience in vision, computational methods and machine learning techniques have allowed us to create a plethora of tools available for you.