Our paper “Challenges in LER/CDU metrology of DSA structures: placement error and cross-line correlations” (http://spie.org/Publications/Proceedings/Paper/10.1117/12.2230849) has been selected as the winner of the Diana Nyyssonen Award for Best Paper at SPIE Metrology, Inspection, and Process Control. The presentation of the award will…
Nanometrisis participates in iPlasmaNano-VII 2016 (16 – 20 OCTOBER 2016, MARE NOSTRUM HOTEL VRAVRONA GREECE) http://www.iplasmanano.org/
Nanometrisis participated at the MNE 2016 (19-23 September 2016, Vienna, Austria). http://mne2016.org/
Nanometrisis participated at the Nanotech France 2016 Conference and Exhibition 01 Jun – 03 Jun 2016 | Paris- France. http://www.setcor.org/conferences/Nanotech-France-2016/conference-program/14
Nanometrisis was at the 13th International Conference on Νanoscience and Nanotechnology 5-8 July 2016 (http://www.nanotexnology.com/index.php/nn). Arrange a B2B meeting with us.
Hilton, Athens. www.greekinnovationforum.eu
In the dimensional metrology of surface nanostructures, two critical challenges have been recently emerged; The first is to determine the metrics (parameters and functions) which quantify the uniformity of feature sizes and the sidewall roughness of each feature (line or…
Nanometrisis has been selected as one of the 30 semi-finalists of the international start-up contest “Hello-Tomorrow” out of +3,500 candidates from 90 countries. See us in Paris at “Hello-Tomorrow” conference on 24-27 June 2015 (www.hello-tomorrow.org/ ).
Nanometrisis will participate in the CIM conference on 21-23 September 2015, Paris, France (www.metrologie2015.com).
Nanometrisis will participate in the 1st DSA symposium on 27-28 October 2015, Leuven, Belgium (www.dsasymposium.org).